کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9817493 1518766 2005 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
A new apparatus for deep patterning of beam sensitive targets by means of high-energy ion beam
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
A new apparatus for deep patterning of beam sensitive targets by means of high-energy ion beam
چکیده انگلیسی
The paper reports on a high precision equipment designed to modify over 3-dimensions (3D) by means of high-energy heavy ions the local properties of thin and thick films. A target-moving system aimed at creating patterns across the volume is driven by an x-y writing protocol that allows one to modify beam sensitive samples over micrometer-size regions of whatever shape. The moving system has a mechanical resolution of 15 nm. The issue of the local fluence measurement has been particularly addressed. The setup has been checked by means of different geometries patterned on beam sensitive sheets as well as on superconducting materials. In the last case the 3D modification consists of amorphous nanostructures. The nanostructures create zones with different dissipative properties with respect to the virgin regions. The main analysis method consists of magneto-optical imaging that provides local information on the electrodynamics of the modified zones. Features typical of non-linear current flow hint at which pattern geometry is more functional to applications in the framework of confined nanostructuring of superconducting films.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 240, Issue 4, December 2005, Pages 842-849
نویسندگان
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