کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9817569 | 1518767 | 2005 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Investigation of doppler broadening of Compton line by PIXE
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
We have investigated the possibility to highlight the Compton broadening effect using proton-induced X-ray emission. A special configuration of the irradiated sample has been chosen: a very thin rhodium layer deposited on a glassy carbon substrate. The X-rays photons are generated in the thin layer of rhodium owing to the ionisation by the proton irradiation. The substrate is in glassy carbon to prevent it to fluoresce. The PIXE results are compared with Monte-Carlo simulation (MCNPX) and with the theoretical model of DuMond et al. A very good agreement is observed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 240, Issues 1â2, October 2005, Pages 293-296
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 240, Issues 1â2, October 2005, Pages 293-296
نویسندگان
V.E. Nuttens, R.L. Hubert, F. Bodart, S. Lucas,