کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9817593 | 1518767 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Study of the Pd-Rh interdiffusion by three complementary analytical techniques: PIXE, RBS and ToF-SIMS
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
Pd diffusion in Rh has a great interest in the 103Pd* production intended to brachytherapy, a cancer treatment using radioactive implants. In order to study that diffusion, DC-magnetron sandwich layers of natural Pd and Rh were produced, annealed, and the Pd profiles were measured by ToF-SIMS. Nevertheless, because ToF-SIMS depth profiles suffer from a lack of quantification and depth calibration, the study was completed by RBS, PIXE. The combination of these techniques allowed us to convert the ToF-SIMS depth profiles from an intensity-time to a concentration-depth profile and thus to study the Pd diffusion in Rh.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 240, Issues 1â2, October 2005, Pages 420-424
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 240, Issues 1â2, October 2005, Pages 420-424
نویسندگان
R.L. Hubert, J. Brison, L. Houssiau, S. Lucas,