کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9817687 | 1518770 | 2005 | 13 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Grazing incidence energy loss of an atomic beam in thermal evanescent field of polaritons near a smooth dielectric/semiconductor surface
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
We explore grazing incidence energy loss of a Cs+ beam reflected from amorphous dielectric/semiconductor surfaces supporting microwave modes. The theoretical analysis shows that a significant part of the beam will be neutralized and therefore, the energy loss of neutrals allows to get direct information about “van der Waals friction” force, which has not yet been obtained using other methods. We study conditions for the resonance interaction between Cs atoms and polariton modes on the surfaces of bulk materials and thin films, where the corresponding effects prove to be more effective. Our calculations show that at the optimized conditions (Ïin = 0.1-1 mrad, E0 â¼Â 50-100 KeV) the “van der Waals friction” turns out to give a noticeable contribution to the total energy loss, with a characteristic dependence on temperature, velocity and material parameters.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 237, Issues 3â4, August 2005, Pages 507-519
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 237, Issues 3â4, August 2005, Pages 507-519
نویسندگان
G.V. Dedkov, A.A. Kyasov,