کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9818120 1518776 2005 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Momentum-imaging spectroscopy of secondary ions from GaN and SiC surfaces collided with highly charged ions at grazing angle
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Momentum-imaging spectroscopy of secondary ions from GaN and SiC surfaces collided with highly charged ions at grazing angle
چکیده انگلیسی
Three-dimensional momentum of sputtered ions were measured in coincidence with scattered Ar atoms in collisions between Arq+ (q = 3, 8, 11, and 14) and 6H-SiC and GaN surfaces at grazing-incidence angle (<0.5°). H+, H2+, Si+ and Ga+ ions were observed in time-of-flight-mass spectra. Sputtering yields of H+ and H2+ increased with increasing charge states of incident ions in proportion to q4. The momenta of these secondary ions emitted from the surfaces were intensively distributed to the direction of surface normal in spite of the grazing collisions. Almost no significant change among different q was found in the kinetic energy distributions of these secondary ions.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 232, Issues 1–4, May 2005, Pages 254-260
نویسندگان
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