کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9818124 | 1518776 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Evaluation of non-resonant background in hydrogen depth profiling via 1H(15N,αγ)12C nuclear reaction analysis near 13.35 MeV
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
Background γ-signals arising from interaction of H in surface layers of the target with the off-resonance cross-section of the 1H(15N,αγ)12C reaction affect H concentration measurements with resonant nuclear reaction analysis (r-NRA) particularly at 15N energies near the 13.35 MeV resonance. This non-resonant background in relation to the on-resonance intensity is determined in the energy range from 6.4 to 13.7 MeV with a thin hydrogenated silicon nitride film on a H-free Si(1 0 0) substrate. The results independently verify earlier evaluations of the off-resonant cross-section, but point out that the γ-detector position relative to the incident ion beam must be accounted for. Based on an estimation of the near-surface H concentration distribution by simulating the yield curves, furthermore a general procedure is proposed to extract the resonant signal related to surface-H from the total γ-yield near 13.35 MeV.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 232, Issues 1â4, May 2005, Pages 280-284
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 232, Issues 1â4, May 2005, Pages 280-284
نویسندگان
Markus Wilde, Katsuyuki Fukutani,