کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9818234 1518777 2005 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Hydrogen depth profiling by p-p scattering in nominally anhydrous minerals
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Hydrogen depth profiling by p-p scattering in nominally anhydrous minerals
چکیده انگلیسی
Nominally anhydrous minerals, both synthesized and of natural occurrence, with hydrogen concentrations from 10 to 100 ppm have been analysed. Hydrous minerals, as well as Mylar foils were used as standards. Depth profiles show that intrinsic hydrogen can be distinguished from surface contaminations, e.g. water adsorbed on the sample surfaces.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 231, Issues 1–4, April 2005, Pages 524-529
نویسندگان
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