Modification of N-doped carbon induced by 30Â MeV C60 ions

In the present work, 120 keV N-ion doped and 30 MeV C60 ion irradiated graphite-like-carbon samples were characterized by RBS, micro-FTIR, micro-Raman, XPS spectroscopy and the variation of the properties of the samples with the N-dopant and/or C60 irradiation fluence have been studied. The RBS spectra showed that C60 irradiation can induce a partial diffusion of N atoms to the surface and the amount of the diffused N atoms increases slightly with increasing C60 irradiation fluence. The FTIR and Raman spectra exhibit characteristic bands of carbon nitrogen bonds showing that the C and N atoms are chemically bonded. The amount of chemically bonded C and N atoms increases with increasing N-dopant. By deconvolution of the XPS spectra, the atomic concentration of N and C atoms were obtained and it was identified that the samples mainly consist of three phases, namely, C3N4, CNx and tetrahedral amorphous carbon. The effect of N-dopant and C60 irradiation fluence on the modification of the properties of the samples is also discussed.