کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9818323 | 1518778 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Electron emission induced by H+ and H0 incident on thin carbon foils: influence of charge changing processes
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
The forward and backward electron emission yields γF and γB have been calculated by Monte Carlo simulation for protons (H+) and hydrogen atoms (H0) (with energies between 25 keV and 5 MeV) incident on thin amorphous carbon foils. Direct electron excitations by the incident projectiles as well as electron excitations resulting from charge exchange processes undergone by H+ or H0 have been taken into account. For the latter, Auger and Shell processes have been considered. Subsequent electron transport has been considered in order to calculate the forward and backward electron emission yields γF and γB.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 230, Issues 1â4, April 2005, Pages 460-465
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 230, Issues 1â4, April 2005, Pages 460-465
نویسندگان
N. Pauly, A. Dubus, M. Rösler, H. Rothard, A. Clouvas, C. Potiriadis,