کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9818328 | 1518778 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Secondary neutral and ionized particle measurements under MeV-energy ion bombardment
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Secondary neutral and ionized particle measurements under MeV-energy ion bombardment Secondary neutral and ionized particle measurements under MeV-energy ion bombardment](/preview/png/9818328.png)
چکیده انگلیسی
We have measured both secondary neutral and ionized particles from an InSb target under 3.0Â MeV Si ion bombardment. Measurements of both ions and neutrals have not been carried out so far in the MeV-energy range. The mass spectra and axial emission energy distributions of secondary particles were investigated. Secondary ions were measured with a linear- and a reflective-type time-of-flight technique, whereas secondary neutral particles were photo-ionized by a UV pulsed laser (ArF: 193Â nm) and measured with a reflective-type time-of-flight technique. Different results were obtained for neutral particles in comparison with ionized particles. The mean energy of neutral Sb atoms was much lower than that of neutral In atoms, whereas the mean energies of secondary In and Sb ions were nearly equal.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 230, Issues 1â4, April 2005, Pages 489-494
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 230, Issues 1â4, April 2005, Pages 489-494
نویسندگان
Yoshihiko Nakata, Satoshi Ninomiya, Chikage Imada, Masafumi Nagai, Takaaki Aoki, Jiro Matsuo, Nobutsugu Imanishi,