کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9821544 | 1518987 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
The difference between the transverse and in-plane resistivity of vacuum evaporated cadmium sulfide (CdS) thin films
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
CdS films were prepared by vacuum evaporation. X-ray diffraction was used to analyze the crystal structure of CdS films. Only hexagonal phase with the preferred orientation of the (0 0 2) plane was found in CdS films. The in-plane and transverse resistivities were measured. The value of in-plane resistivities is in the range of 0.333-18.9Ωcm at room temperature. The value of transverse resistivities was about 8 orders more than that of in-plane resistivities. The relationship between the in-plane resistivity and the substrate temperature was different from that of the transverse resistivity and the substrate temperature. The in-plane resistivity of CdS films had a minimum at the substrate temperature of 150 °C, while the transverse resistivity of CdS films had the maximum at the substrate temperature of 150 °C.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 79, Issues 1â2, 8 July 2005, Pages 14-18
Journal: Vacuum - Volume 79, Issues 1â2, 8 July 2005, Pages 14-18
نویسندگان
Zhibing He, Gaoling Zhao, Wenjian Weng, Piyi Du, Ge Shen, Gaorong Han,