کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9821595 | 1518988 | 2005 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
A low energy ion beam line for highly charged ions
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
An ion beam line is presented, which is designed to study the interaction of highly charged ions with matter, especially solid surfaces. The highly charged ions are produced in a room temperature electron beam ion trap, the Dresden EBIT [1,2]. This device delivers bare nuclei up to elements with an atomic number of about 28, and neon-like ions up to about Z=80. After leaving the trap the ion beam containing several neighbouring ion charge states passes through standard ion optics elements before entering an analysing magnet for separating a certain ion charge state. In a following deceleration unit, which will be integrated soon, the ions can be slowed down to a definite kinetic energy of a few eV. The characteristic of the HCI beam is presented, combined with ion extraction spectra of selected elements detected by a Faraday cup after passing through an analysing magnet.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 78, Issues 2â4, 30 May 2005, Pages 319-323
Journal: Vacuum - Volume 78, Issues 2â4, 30 May 2005, Pages 319-323
نویسندگان
Günter Zschornack, Steffen Landgraf, Frank Grossmann, Ulrich Kentsch, Vladimir P. Ovsyannikov, Mike Schmidt, Falk Ullmann,