کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9834712 | 1524913 | 2005 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Exchange bias and magnetization process of Co/CoO nanocomposite thin films
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Exchange bias and magnetization process of Co/CoO nanocomposite thin films Exchange bias and magnetization process of Co/CoO nanocomposite thin films](/preview/png/9834712.png)
چکیده انگلیسی
Co/CoO nanocomposite thin films have been deposited by RF sputtering with different oxygen partial pressures in the working atmosphere. It has been found that the magnetic properties (exchange bias (EB), coercivity and remanence) of the films are strongly dependent on the oxygen partial pressure. Film deposited with an O2 pressure of 0.75Ã10â5Â Torr shows a relatively high coercivity and high remanence ratio. Enhanced asymmetry of magnetization reversal appears in the film deposited with 1.5Ã10â5Â Torr O2 partial pressure. When the O2 partial pressure is increased to 3.0Ã10â5Â Torr, a strong reduction in EB and coercivity have been obtained. The investigation of the microstructure using high-resolution transmission electron microscope reveals that the change in EB, remanence and coercivity is probably related to the competition between dipolar interaction and exchange coupling. Magnetoresistance and extraordinary Hall effect (EHE) of the Co/CoO nanocomposite films is also investigated in dependence on oxygen partial pressure. The film deposited under 2.3Ã10â5Â Torr of oxygen exhibits strongly enhanced asymmetric magnetization reversal and unusually high EHE with a high coercivity.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Magnetism and Magnetic Materials - Volume 285, Issues 1â2, January 2005, Pages 224-232
Journal: Journal of Magnetism and Magnetic Materials - Volume 285, Issues 1â2, January 2005, Pages 224-232
نویسندگان
J.B. Yi, J. Ding, B.H. Liu, Z.L. Dong, T. White, Y. Liu,