کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9844912 1526503 2005 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Charge collection properties of heavily irradiated epitaxial silicon detectors
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم ابزار دقیق
پیش نمایش صفحه اول مقاله
Charge collection properties of heavily irradiated epitaxial silicon detectors
چکیده انگلیسی
Detectors processed on epitaxial silicon seem to be a viable solution for the extreme radiation levels in the innermost layers of tracking detectors at upgraded LHC (SLHC). A set of epitaxial pad detectors of 50 and 75μm thicknesses (ρ=50Ωcm) was irradiated with 24GeV/c protons and reactor neutrons up to equivalent fluences of 1016cm-2. Charge collection for minimum ionizing electrons from a 90Sr source was measured using a charge sensitive preamplifier and a 25 ns shaping circuit. The dependence of collected charge on annealing time and operation temperature was studied. Results were used to predict the performance of fine pitch pixel detectors proposed for SLHC.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 554, Issues 1–3, 1 December 2005, Pages 212-219
نویسندگان
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