کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9845362 1526512 2005 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Influence of backscattering on the spatial resolution of semiconductor X-ray detectors
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم ابزار دقیق
پیش نمایش صفحه اول مقاله
Influence of backscattering on the spatial resolution of semiconductor X-ray detectors
چکیده انگلیسی
We found a significant degradation of the MTF compared to the case without backscattering. At energies above the K-edge of the backscattering material the spatial resolution drops and can account for the observed low-frequency drop of the MTF. Ignoring this backscatter effect might lead to misinterpretations of the charge sharing effect in counting pixel detectors.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 546, Issues 1–2, 1 July 2005, Pages 252-257
نویسندگان
, , ,