Hydrogen storage in Mg2FeSi alloy thin films depending on the Fe-to-Si ratio measured by conversion electron Mössbauer spectroscopy

Sputter deposited Mg2FexSi1-x films of 250 nm thickness have been investigated by means of Mössbauer spectroscopy. While non-hydrogenated films are characterized by a quadrupole split doublet, hydrogenated regions show a singlet with reduced isomer shift. The relative areas of the spectra reflect the relation between loaded and unloaded regions prepared at the same loading conditions.