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Daneshyari Control and Systems Engineering Journas Latest Articles

Control and Systems Engineering Research Articles

Parametric and nonparametric curve fitting
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NANO ELECTRO MECHANICAL SYSTEMS WITH SINGLE WALLED CARBON NANOTUBES AS FUNCTIONAL ELEMENTS
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Concepts for a mechatronic device to control intracranial pressure
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A MEMS-BASED MICRO-BIOPSY ACTUATOR FOR CAPSULAR ENDOSCOPE USING LIGA PROCESS
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SMART MECHATRONIC DEVICE TO ASSIST HEART FUNCTION
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DESIGN OF EXPERIMENTAL PLATFORM FOR TESTING REAL-TIME DATABASE TRANSACTION PROCESSING
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CONFIGURABLE 8-BIT MICROCONTROLLER IP CORE AS A BASIS FOR EFFECTIVE SYSTEM ON CHIP IMPLEMENTATION
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HIERARCHICAL SELF TEST FOR SOCS INCLUDING LOGIC AND INTERCONNECTS
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STATISTICAL DETECTION OF THE FAULTY BEHAVIOUR OF ISLIP-BASED SCHEDULERS FOR VOQ SWITCHES
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AMCAS: ADVANCED METHODS FOR THE CO-DESIGN OF COMPLEX ADAPTIVE SYSTEMS
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A NEW HEURISTIC ALGORITHM FOR SEQUENTIAL TWO-BLOCK DECOMPOSITION OF BOOLEAN FUNCTIONS
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THE RELEVANCE OF ENERGY SAVING CONTROL
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On the degree of polynomial parameter-dependent Lyapunov functions for robust stability of single parameter-dependent LTI systems: A counter-example to Barmish's conjecture
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Derivation of a mathematical model for pneumatic artificial muscles
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Robust exponential convergence of a class of linear delayed systems with bounded controllers and disturbances
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A note on the optimal expansion of Volterra models using Laguerre functions
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Keyword index, volume 42, 2006
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Safe, secure and ethical e-society
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Model reduction in the presence of uncertainty in model parameters
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Modelling sound production from an aerodynamical model of the human newborn larynx
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Effects of package and process variation on 2.4 GHz analog integrated circuits
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EBSD measurements of elastic strain fields in a GaN/sapphire structure
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Temperature effects on DC and small signal RF performance of AlGaAs/GaAs HEMTs
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Effect of reverse substrate bias on ultra-thin gate oxide n-MOSFET degradation under different stress modes
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Study of the power capability of LDMOS and the improved methods
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A FORMULATION AND A NUMERICAL SCHEME FOR FRACTIONAL OPTIMAL CONTROL PROBLEMS
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A further note on stability criterion of linear neutral delay-differential systems
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BACKWARD EULER METHOD AS A POSITIVITY PRESERVING METHOD FOR ABSTRACT INTEGRAL EQUATIONS OF CONVOLUTION TYPE
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FRACTIONAL MODELS OF LOUDSPEAKER COILS
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IDENTIFICATION OF THE FRACTIONAL IMPEDANCE OF ULTRACAPACITORS
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ADAPTIVE DISCRETIZATION OF AN INTEGRO-DIFFERENTIAL EQUATION MODELING QUASI-STATIC FRACTIONAL ORDER VISCOELASTICITY
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THE Gα-SCHEME TO APPROXIMATE FRACTIONAL DERIVATIVES — APPLICATION TO DYNAMICS OF DISSIPATIVE SYSTEMS
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NEW DIRECT DISCRETIZATION OF THE FRACTIONAL-ORDER DIFFERENTIATOR/INTEGRATOR BY THE CHEBYSHEV-PADÉ APPROXIMATION
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MODELING AND SIMULATION OF A FRACTIONAL ORDER BIOREACTOR SYSTEM
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VARIABLE STRUCTURE CONTROL OF FRACTIONAL TIME-DELAY SYSTEMS
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SOLUTIONS TO SOME FRACTIONAL DIFFERENTIAL EQUATIONS OF VISCOELASTIC VIBRATION BY MEANS OF N- FRACTIONAL CALCULUS
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SOME APPLICATIONS OF THE MULTIPLY ELEMENTS BETA FUNCTIONS TO SOME FUNCTIONS OBTAINED FROM THE N-FRACTIONAL CALCULUS OF A POWER FUNCTION
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ANALOG IMPLEMENTATION OF NON INTEGER ORDER INTEGRATOR VIA FIELD PROGRAMMABLE ANALOG ARRAY
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On solution schemes for time-independent thermomechanical analysis for structures containing polymeric materials
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ANALYSIS OF OBSERVER-BASED FAULT TOLERANT CONTROL SYSTEMS WITH MARKOVIAN PARAMETERS
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FREQUENCY-DOMAIN IDENTIFICATION OF CONTINUOUS-TIME OUTPUT ERROR MODELS FROM NON-UNIFORMLY SAMPLED DATA
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A MODIFIED LEAST SQUARE ALGORITHM IMPROVING JILES ATHERTON HYSTERESIS MODEL IDENTIFICATION
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SELF-ORGANIZING MAPS FOR ANALYSIS OF EPS-BATCH PROCESS
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ON THE CHOICE OF CLOSED-LOOP BLOCK POLES IN MULTIVARIABLE CONTROL DESIGN
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BEYOND THE CONSTRUCTION OF OPTIMAL SWITCHING SURFACES FOR AUTONOMOUS HYBRID SYSTEMS
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MAGNETIC SUSPENSION SYSTEM USING THREE FLUX PATH CONTROL MODULES
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Estimation of angular velocity and acceleration by using 2 linear acceleration sensors
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VISUAL OBSERVER FOR MULTI-LINK MECHANICAL SYSTEM
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HAPTIC DEVICES AS NEW MECHATRONIC COMPONENTS FOR INTERACTIVE GRID APPLICATIONS
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THE WINDUP PROBLEM IN REPETITIVE CONTROL: A SIMPLE ANTI-WINDUP STRATEGY
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Localization and physical analysis of a complex SRAM failure in 90nm technology
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Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation
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High brightness GaN LEDs degradation during dc and pulsed stress
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Strong electron irradiation hardness of 852 nm Al-free laser diodes
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Charging-Effects in RF capacitive switches influence of insulating layers composition
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Charging of radiation induced defects in RF MEMS dielectric films
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Novel ESD strategy for high voltage non-volatile programming pin application
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Experimental investigation on the impact of stress free temperature on the electromigration performance of copper dual damascene submicron interconnect
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The effect of Cu diffusion on the TDDB behavior in a low-k interlevel dielectrics
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Development of highly accelerated electromigration test
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Transient-induced latch-up test setup for wafer-level and package-level
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Post-breakdown leakage resistance and its dependence on device area
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Gate voltage and oxide thickness dependence of progressive wear-out of ultra-thin gate oxides
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Kelvin probe force microscopy – An appropriate tool for the electrical characterisation of LED heterostructures
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Numerical evaluation of miniaturized resistive probe for quantitative thermal near-field microscopy of thermal conductivity
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Time gating imaging through thick silicon substrate: a new step towards backside characterisation
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Modeling and gradient pattern analysis of irregular SFM structures of porous silicon
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A Ku band four-stage PHEMT 1W MMIC power amplifier
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On the uniformity of field emission in screen printed CNT-cathodes: The effects of the cathode roughness
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Simulation and optimization on the squeeze-film damping of a novel high-g accelerometer
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Nanometer range: A new theoretical challenge for microelectronics and optoelectronics
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Thickness dependence of the structural and electrical properties of copper films deposited by dc magnetron sputtering technique
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Alloy splitting of Te-DX in AlxGa1−xAs analysis using the deep level transient spectroscopy technique
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A novel double RESURF LDMOS and a versatile JFET device used as internal power supply and current detector for SPIC
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Influence of TCE concentration in thermal oxidation on reliability of SiC MOS capacitors under Fowler–Nordheim electron injection
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Development of bulk nanostructured copper with superior hardness for use as an interconnect material in electronic packaging
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Large area recrystallization of thick polysilicon films for low cost partial SOI power devices
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A New Emitter Switched Thyristor (EST) employing Trench Segmented p-base
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Patterning by rapid thermal annealing of GaAs layers grown on diluted nitride QWs
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Self-organized GaAs patterns on misoriented GaAs (1 1 1)B substrates using dilute nitrides by molecular beam epitaxy
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Si–C multilayer quasi crystals preparation by DC magnetron sputtering
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Size dependence of hall mobility and dislocation density in Ge heteroepitaxial layers grown by MBE on a SiO2 patterned Si template
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Growth, structure, and morphology of TiO2 films deposited by molecular beam epitaxy in pure ozone ambients
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Effect of nanoimprinted surface relief on Si and Ge nucleation and ordering
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Improvements of stacked self-assembled InAs/GaAs quantum dot structures for 1.3 μm applications
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Determination of thermal resistance using Gummel measurement for InGaP/GaAs HBTs
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Effect of annealing on the properties of low-k nanoporous SiO2 films prepared by sol–gel method with catalyst HF
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A Note on the Unified Forms of Triple I Method
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Electronic conductance in binomially tailored quantum wire
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The fabrication and operation of fully printed Carbon nanotube field emission displays
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Development of pNH4-isfets microsensors for water analysis
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A fast driver circuit for single-photon sensors
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Simulation of electronic/ionic mixed conduction in solid ionic memory devices
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Influence of hydrogen dilution and substrate temperature on growth of nanocrystalline hydrogenated silicon carbide films deposited by RF sputtering
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Stabilized emission from micro-field emitter for electron microscopy
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Reliability of high temperature solder alternatives
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Device level electrical-thermal-stress coupled-field modeling
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Dynamic voltage stress effects on nMOS varactor
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Failure Analysis-assisted FMEA
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