
In-line holographic electron microscopy in the presence of external magnetic fields
Keywords: 61.14.Nm; 42.30.Va; 42.40.Kw; 42.88.+h; 42.25.Dd; Point-source holographic microscopy; Electron scattering and diffraction; Aharonov-Bohm effect; Fresnel-Kirchhoff theory; Digital holography; Hologram reconstruction methods; Signal-to-noise ratio;