Calculated influence of work function on SE escape probability and Secondary Electron Emission yield
Keywords: 73.23.P; 79.20Hx; 61.16Bg; 73.23.Ps; 73.30.+y; 81.05.ât; Secondary electron emission; Spectral and angular distribution of secondary electrons; Scanning electron microscopy; Contamination effect; Crystalline contrast; Thin films;