
Study on topographic images of Sn/Si(1 1 1)-(â3 à â3)R30° surface by non-contact AFM
Keywords: Sn (tin); Si (silicon); (â3 Ã â3)R30° phase; Non-contact atomic force microscope; NC-AFM; Substitutional defect; Low temperature; Tip-sample distance dependence; Electrostatic force; Chemical bonding force; Covalent bonding force; AFM image; Frequ