کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5426588 | 1395892 | 2006 | 6 صفحه PDF | دانلود رایگان |

Various contrast of topographic images depending on a state of a tip apex on Sn/Si(1 1 1)-(â3 Ã â3)R30° surface was investigated using a low temperature non-contact AFM. With the type A tip, the image of the ring-type Sn, composed of six Sn atoms surrounding substitutional Si defect, was observed when the frequency shift (â£Îfâ£) was small (the tip-sample distance, Ztip-sample, was long), while the ring-type Sn was not observed and all the Sn atoms have the same contrast when â£Îf⣠was large (Ztip-sample was short). On the other hand, with the type B tip, modified from the type A tip by the tip-sample contact, the image of the ring-type Sn atoms was not observed regardless of variation of Îf. It is the first experimental result on the low temperature NC-AFM observation in the Sn/Si(1 1 1) system, which depends on short-range chemical bonding force or electrostatic force acting between the tip and the sample surface. In addition, the substitutional Si defects on the surface were seen as a dim spot or were not seen, also depending on the tip state.
Journal: Surface Science - Volume 600, Issue 17, 1 September 2006, Pages 3382-3387