Keywords: الکترونهای متقارن; 3D; three-dimensional; TEM; transmission electron microscopy; SEM; scanning electron microscope; SSTEM; serial section TEM; SBF-SEM; serial block face-SEM; Plate-TEM; plate-transmission electron microscopy; GSO; gadolinium silicon oxide; YAG; yttrium alum
مقالات ISI الکترونهای متقارن (ترجمه نشده)
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در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Keywords: الکترونهای متقارن; BSE; backscattered electrons; BSED; back-scattered electron detector; GI; gastrointestinal; gwt; gram of wet tissue; IARC; International Agency for Research on Cancer; MFs; microscopic fields; MPM; malignant pleural mesothelioma; NIOSH; National Institute
Keywords: الکترونهای متقارن; IUPAC; International Union of Pure and Applied Chemistry; PLA; polylactide; PVA; polyvinyl alcohol; EtOH; ethyl alcohol; DVB; divinyl benzene; AIBN; azobisisobutyronitrile; DBP; dibutyl phthalate; ACN; acetonitrile; THF; tetrahydrofuran; PVP; polyvinylpyr
Keywords: الکترونهای متقارن; Scanning electron microscopy; Backscattered electrons; Low electron energy; Composition quantification; InGaAs;
Keywords: الکترونهای متقارن; BSE; Backscattered electron; HeIM; Helium ion microscope; Organic photovoltaics; Morphology; Backscattered electrons; Polymers; Scanning electron microscopy;
Keywords: الکترونهای متقارن; BSE; backscattered electrons; BIRC; biologically-initiated rock crust; B-surface; uneven non-tectonic surface with a developed BIRC; C-surface; exposed surface of a tectonic fracture with a developed BIRC; EPS; extracellular polymeric substances; F-surfac
Keywords: الکترونهای متقارن; Void swelling; Imaging; Backscattered electrons;
Keywords: الکترونهای متقارن; Nano-antimicrobials; Nano-antimicrobial composites; Antimicrobial resistance; Nanoparticle synthesis; Nanotoxicology; AAS; Atomic absorption spectroscopy; AFM; Atomic force microscopy; ATR-FTIR; Attenuated total reflectance - Fourier transform infrared
Keywords: الکترونهای متقارن; μ; linear X-ray attenuation coefficient; μXRF; micro-X-ray fluorescence spectroscopy; 2D; two-dimensional; 3D; three-dimensional; A; cross-sectional surface area; BGK; Bhatnagar-Gross-Cook approximation; BIB-SEM; broad ion beam scanning electron mic
Keywords: الکترونهای متقارن; Phosphor powder; Secondary electrons; Backscattered electrons; Interaction volume; Phosphor saturation;
Keywords: الکترونهای متقارن; VP-ESEM; Lateral spatial resolution; X-ray microanalysis; Backscattered electrons; Skirt;
Keywords: الکترونهای متقارن; EM; electron microscopy; TEM; transmission electron microscopy; SEM; scanning electron microscopy; CCD; charge-coupled device; SE; secondary electron; BSE; backscattered electrons; TSEM; transmission scanning electron microscopy; STEM; scanning transmissi
High-efficiency detector of secondary and backscattered electrons for low-dose imaging in the ESEM
Keywords: الکترونهای متقارن; Detectors; Scintillators; Low-dose imaging; Energy filtration; MC simulations; BE; beam electrons; BSE; backscattered electrons; CSSBE; a Combined System for high-efficiency detection of Secondary and Backscattered Electrons; ESD; Environmental Secondary
Gas effect on the emission and detection of the backscattered electrons in a VP-SEM at low energy
Keywords: الکترونهای متقارن; VP-SEM; Backscattered electrons; Skirt; Diffused fraction;
An optimized methodology to analyze biopolymer capsules by environmental scanning electron microscopy
Keywords: الکترونهای متقارن; Scanning electron microscopy; Environmental mode; Encapsulation; Coating; Biopolymer; Capsules; Backscattered electrons
Practical aspects of the use of the X2 holder for HRTEM-quality TEM sample preparation by FIB
Keywords: الکترونهای متقارن; FIB; TEM specimen preparation; Sample thickness; Backscattered electrons; EDX; Monte; Carlo simulations; Sub-kV argon milling;
Backscattered electron imaging at low emerging angles: A physical approach to contrast in LVSEM
Keywords: الکترونهای متقارن; Backscattered electrons; Low Voltage Scanning Electron Microscopy; Work function effects; Surface properties;
3D-measurement using a scanning electron microscope
Keywords: الکترونهای متقارن; Scanning electron microscope; Photometric method; Shape from shading; Secondary electrons; Backscattered electrons
Determination of the electron beam irradiated area by using a new procedure deriving from the electron beam lithography technique
Keywords: الکترونهای متقارن; 85.50; 85.40.H; Electron beam irradiated area; Electron beam lithography; Substrate charging; Backscattered electrons;
High spatial resolution studies of surfaces and small particles using electron beam techniques
Keywords: الکترونهای متقارن; UHV electron microscopy; Secondary electrons; Auger electrons; Backscattered electrons; Surfaces; Small particle catalysts;