Keywords: بررسی نقص; Shield tunnel; Defect inspection; Deep learning; Computer vision; Image recognition; Fully convolutional network;
مقالات ISI بررسی نقص (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Keywords: بررسی نقص; Defect inspection; Anisotropic diffusion; Radial basis function neural network; Back-propagation neural network;
Keywords: بررسی نقص; Machine vision; Defect inspection; Edge of light; Imaging enhancement mechanism; Polymeric polarizer; Extremely slight transparent aesthetic defect;
Keywords: بررسی نقص; Titanium alloy honeycomb; Intimate contact disbonds; Lock-in thermography; Defect inspection;
Keywords: بررسی نقص; Solder ball; Defect inspection; Active thermography; Principal component analysis (PCA); Probabilistic neural network (PNN);
Keywords: بررسی نقص; Machine vision; Defect inspection; Structured-light illumination; Imaging enhancement mechanism; Polymeric polarizer;
Keywords: بررسی نقص; Machine vision; Defect inspection; Structured-light illumination; Polymeric polarizer; RPCA algorithm; Transparent defects;
Keywords: بررسی نقص; Back propagation network; Defect inspection; Flip chip; Genetic algorithm; Vibration analysis;
Keywords: بررسی نقص; Optical coherence tomography; Touch-screen panel; Nondestructive optical inspection; Defect inspection
Keywords: بررسی نقص; Automatic optical inspection; Defect inspection; Touch panel
Using GA-SVM for defect inspection of flip chips based on vibration signals
Keywords: بررسی نقص; Flip chip; Defect inspection; Genetic algorithms (GA); Support vector machine (SVM); Vibration signal;
Defect inspection of solder bumps using the scanning acoustic microscopy and fuzzy SVM algorithm
Keywords: بررسی نقص; Fuzzy SVM algorithm; Defect inspection; Solder bump; Scanning acoustic microscopy;
Defect inspection for TFT-LCD images based on the low-rank matrix reconstruction
Keywords: بررسی نقص; Defect inspection; Low-rank matrix reconstruction; LCDs; IALM; Adaptive parameter selection
Using BP network for ultrasonic inspection of flip chip solder joints
Keywords: بررسی نقص; Flip chip; Back-propagation network; Defect inspection; Ultrasonic inspection
Bearing defect inspection based on machine vision
Keywords: بررسی نقص; Machine vision; Bearings; Flaw detection; Visual system; Defect inspection
Nondestructive defect inspection for LCDs using optical coherence tomography
Keywords: بررسی نقص; TFT-LCD; Defect inspection; Nondestructive inspection; Optical coherence tomography
Automated defect inspection of light-emitting diode chips using neural network and statistical approaches
Keywords: بررسی نقص; Defect inspection; LED chip; Wavelet characteristics; Neural network model; Multivariate statistical analysis
Mirror electron microscope for inspecting nanometer-sized defects in magnetic media
Keywords: بررسی نقص; Mirror electron microscope; Magnetic media; Defect inspection
Measuring the convergence and accuracy of trainees' knowledge structures for TFT-LCD visual defect categorization
Keywords: بررسی نقص; TFT-LCD; Defect inspection; Knowledge structures; Card sorting; Edit distance; Collective dice coefficient;