Advanced processing of EBSD data to distinguish the complex microstructure evolution of a Cu-Ni-Si alloy induced by fatigue
Keywords: ECCI; Electron Channeling Contrast Imaging; Îεt; total strain variation; EBSD; Electron Back-scattered Diffraction; FSE; Forward Scattered Electrons; GOS; Grain Orientation Spread; GROD; Grain Reference Orientation Deviation; IPF; Inverse Pole Figure; I