
MnxGe1âx thin layers studied by TEM, X-ray absorption spectroscopy and SQUID magnetometry
Keywords: طیف سنجی جذب اشعه ایکس; Metal-semiconductor interfaces; Manganese; Germanium; Electron microscopy; Electron-solid diffraction; X-ray absorption spectroscopy; Soft X-ray photoelectron spectroscopy; Magnetic measurements;