Fourier-inversion and wavelet-transform methods applied to X-ray reflectometry and HRXRD profiles from complex thin-layered heterostructures
Keywords: بازتابی از اشعه ایکس; X-ray reflectometry; High resolution X-ray diffractometry; Semi-conductor heterostructures; Opto-electronic devices; Thickness determination; Fast Fourier transform; Wavelet transform;