کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10364228 871562 2005 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Testing high resolution ΣΔ ADC's by using the quantizer input as test access
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Testing high resolution ΣΔ ADC's by using the quantizer input as test access
چکیده انگلیسی
A new solution to improve the testability of high resolution ΣΔ Analogue to Digital Converters (ΣΔ ADC's) using the quantizer input as test node is described. The theoretical basis for the technique is discussed and results from high level simulations for a 16 bit, fourth order, audio ADC are presented. The analysis demonstrates the potential to reduce the computational effort associated with test response analysis versus conventional techniques. If only SNR, THD and gain of the ΣΔ ADC are evaluated with the new proposed method the test time is already reduced by 20%.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Journal - Volume 36, Issue 9, September 2005, Pages 810-819
نویسندگان
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