Test generation for specification test of analog circuits using efficient test response observation methods

In this paper, a new automated test generation methodology for specification testing of analog circuits using test point selection and efficient analog test response waveform capture methods for enhancing the test accuracy is proposed. The proposed approach co-optimizes the construction of a multi-tone sinusoidal test stimulus and the selection of the best set of test response observation points. For embedded analog circuits, it uses a subsampling-based digitization method compatible with IEEE 1149.1 to accurately digitize the analog test response waveforms. The proposed specification approach uses 'alternate test' framework, in which the specifications of the analog circuit-under-test are computed (predicted) using statistical regression models that are constructed based on process variations and corresponding variations of test responses captured from different test observation points. The test generation process and the test point selection process aim to maximize the accuracy of specification prediction. Experimental results validating the proposed specification test approach are presented.