کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10364471 | 871721 | 2005 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Atomic scale engineering of nanostructures at silicon carbide surfaces
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
The atomic scale ordering and properties of cubic silicon carbide surfaces are investigated by room and high-temperature scanning tunneling microscopy. In this review, we will focus on the Si-terminated β-SiC(100) surfaces only. Self-formation of Si atomic lines and dimer vacancy chains on the β-SiC(100) surface is taking place at the phase transition between the 3Ã2 (Si-rich) and c(4Ã2) surface reconstructions. Using a rigorous protocol in surface preparation, it is possible to build very long, very straight and defect free Si atomic lines, forming a very large superlattice of massively parallel lines. These self-organized atomic lines are driven by stress. They have unprecedented characteristics with the highest thermal stability ever achieved for nanostructures on a surface (900 °C) and the longest atomic lines ever built on a surface (micrometer scale long). Investigating their dynamics, we learn that their dismantling at high-temperature results from collective and individual mechanisms including one-by-one dimer removal. Overall, this is a model system especially suitable for nanophysics and nanotechnologies.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Journal - Volume 36, Issue 11, November 2005, Pages 969-976
Journal: Microelectronics Journal - Volume 36, Issue 11, November 2005, Pages 969-976
نویسندگان
Patrick Soukiassian, Vincent Derycke, Fabrice Semond, Victor Yu. Aristov,