کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10365168 871952 2005 19 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Approximate process-parameter-dependent study of the logarithmic domain lossy integrator harmonic distortion levels
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Approximate process-parameter-dependent study of the logarithmic domain lossy integrator harmonic distortion levels
چکیده انگلیسی
This paper estimates approximately and sheds light in an insightful way upon the impact of the basic bipolar process parameters upon harmonic distortion for the log-domain lossy integrator case. A step-by-step, symbolic, transistor-level distortion calculation is elaborated. The determination of the harmonic distortion levels present at the integrator's output is based upon the exploitation on the medium complexity Charge-Control-Model (CCM) for the Bipolar Junction Transistor (BJT). Results correlating the input signal strength with the impact of basic BJT non-idealities (e.g. finite beta values, parasitic base and emitter resistances) upon the output linearity levels are provided.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Journal - Volume 36, Issue 1, January 2005, Pages 5-23
نویسندگان
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