کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10365491 872100 2005 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Process optimization and characterization of silicon microneedles fabricated by wet etch technology
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Process optimization and characterization of silicon microneedles fabricated by wet etch technology
چکیده انگلیسی
In this research, we have optimized a fabrication technique for manufacturing microneedle arrays in standard silicon wafer ((100) orientation) using potassium hydroxide (KOH) wet etching. The etch behaviour of silicon was simulated for different mask shapes and sizes using SIMODE software. In the context of the fabrication process, we demonstrate the influence of the mask design and the processing environment such as etching parameters and etch bath conditions on the formation of silicon microneedle structures (needle height up to 300 μm) and its reproducibility. Single needle shear tests have been carried out to characterize the mechanical stiffness of fabricated microneedles.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Journal - Volume 36, Issue 7, July 2005, Pages 650-656
نویسندگان
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