کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10365693 | 872161 | 2014 | 11 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
A yield improvement technique in severe process, voltage, and temperature variations and extreme voltage scaling
ترجمه فارسی عنوان
یک تکنیک بهبود عملکرد در فرآیند شدید، ولتاژ و تغییرات دما و مقیاس ولتاژ شدید
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کلمات کلیدی
عملکرد زمانبندی، طراحی زیرمجموعه تعویض بدن جلو، روند، درجه حرارت، تغییرات ولتاژ،
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
چکیده انگلیسی
Drastic yield reduction at sub/nearthreshold voltage domains, caused by the severe process, voltage, and temperature (PVT) variations in this region, is challenging characteristic of recent nanometre sensory chips. Using a variation sensitive and ultra-low-power design, this paper proposes a novel technique capable of sensing and responding to PVT variations by providing an appropriate forward body bias (FBB) so that the delay variations and timing yield of whole system as well as energy-delay product (EDP) are improved. Theoretical analysis for the error probability, confirmed by post-layout HSPICE simulations for an 8-bit Kogge-Stone adder and also two large Fast Fourier Transform (FFT) processors, shows considerable improvements in severe PVT variations and extreme voltage scaling. For this adder, for example, the proposed technique can reduce error rate from 50% to 1% at 0.4Â V. In another implementation, in average â¼7Ã delay variation and â¼4Ã EDP improvement is gained after this technique is applied to an iterative 1024pt, radix 4, complex FFT while working in sub/nearthreshold voltage region of 0.3Â V-0.6Â V. Also, pipelined version of the FFT consumed only 412pJ/FFT at 0.4Â V while processing 125Â K FFT/sec.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 54, Issue 12, December 2014, Pages 2813-2823
Journal: Microelectronics Reliability - Volume 54, Issue 12, December 2014, Pages 2813-2823
نویسندگان
Mohsen Radfar, Jack Singh,