کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10415242 897339 2005 14 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Stress intensity factors of semi-elliptical surface cracks in pressure vessels by global-local finite element methodology
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی مکانیک
پیش نمایش صفحه اول مقاله
Stress intensity factors of semi-elliptical surface cracks in pressure vessels by global-local finite element methodology
چکیده انگلیسی
In the present study the problem of calculation of the stress intensity factors (SIF) of semi-elliptical cracks located in the stress concentration areas of a pressure vessel is numerically solved by advanced global-local finite element (FE) analysis. The common characteristic of the cases solved is that the stress field at the crack area varies along the axial, the circumferential, as well as, the through-the-thickness directions. SIF solutions for such problems are not available, neither analytically, nor numerically, as the currently existing solutions in the literature (numerical results, Newman-Raju empirical equations, weight function solutions, etc.) are only valid for uniform stress distribution along the axial and circumferential directions of the pressure vessel and allow variation only through-the-thickness. The crack locations considered are the intersection of the cylinder to a nozzle and the connection of the cylinder with its hemi-spherical ends. The stress intensity factors are presented in a suitable table format for various geometrical configurations of both the pressure vessel and the semi-elliptical crack, thus providing a useful tool for the fracture mechanics design of cracked pressure vessels. The modeling details of the sub-structuring methodology, employed in the analysis, are extensively discussed and the numerical approach is proven to be very efficient for the SIF calculation of pressure vessel semi-elliptical cracks.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Engineering Fracture Mechanics - Volume 72, Issue 9, June 2005, Pages 1299-1312
نویسندگان
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