کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10618727 988184 2005 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Molecular orientation in ultrathin films of α-sexithiophene on silicon dioxide revealed by spatially resolved confocal spectroscopy
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد بیومتریال
پیش نمایش صفحه اول مقاله
Molecular orientation in ultrathin films of α-sexithiophene on silicon dioxide revealed by spatially resolved confocal spectroscopy
چکیده انگلیسی
In organic semiconductors devices like thin film transistors (TFTs), the supra-molecular organization on the substrate is one of the most important parameters to control the charge transport. Unprecedented insights into the molecular orientation of vacuum sublimed ultrathin films of α-sexithiophene (T6) on silicon dioxide are revealed by confocal laser scanning microscopy (CLSM) and spectroscopy. By the cross correlation of confocal microscopy and atomic force microscopy measurements, we demonstrated that in films thinner than 2 nm, regions where molecules are oriented perpendicular to the substrate and regions where molecules are parallel to the substrate co-exist. By spatially resolved spectroscopy, we gain information about the supra-molecular organization in ultrathin films. Implications for charge transport in thin film transistors are considered and discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Synthetic Metals - Volume 155, Issue 2, 15 November 2005, Pages 287-290
نویسندگان
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