کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10625701 989632 2013 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
The evolution behavior of microstructures and optical properties of ZnO films using a Ti buffer layer
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
The evolution behavior of microstructures and optical properties of ZnO films using a Ti buffer layer
چکیده انگلیسی
ZnO thin films without and with Ti buffer layer were prepared on Si and glass substrates by radio frequency (RF) magnetron sputtering. The effects of Ti buffer layer with different sputtering time on the microstructure and optical properties of ZnO thin films had been investigated by means of X-ray diffraction (XRD), energy dispersive spectrometer, X-fluorescence spectrophotometer and ultraviolet-visible spectrophotometer. The XRD results showed that the full-width at half-maximum (FWHM) for the ZnO (002) diffraction peak gradually decreased with the increase of sputtering time of Ti buffer layer, indicating that the crystalline quality of ZnO thin films was improved. The UV peak located at 390 nm, two blue peaks located at about 435 and 487 nm, two green peaks located at about 525 and 560 nm were observed from PL spectra. The PL spectra showed that the strongest blue light emission of ZnO films was obtained from Ti buffer layer with the sputtering time of 10 min. Meanwhile, the origins of the emission peaks were discussed through the Gaussian deconvolution. We also studied the optical band gaps.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ceramics International - Volume 39, Issue 7, September 2013, Pages 7993-7999
نویسندگان
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