Fictive temperature and fictive pressure measurement of silica glasses using FTIR method: For thick samples and samples containing Si-H

► IR peak at 2660 cm− 1 band can be used as a measure of fictive temperature of silica glasses. ► Unlike 2260 cm− 1 band, 2660 cm − 1 band is not affected by Si-H band. ► Compared with 2260 cm− 1, thicker glass specimens can be measured. ► By combining both peaks, fictive temperature effect and fictive pressure effect can be distinguished.