کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10634223 993432 2005 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
A comment on 'Crystallography and migration mechanisms of planar interface boundaries' Acta Materialia, 52, 795-807 (2004) by J. F. Nie
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
A comment on 'Crystallography and migration mechanisms of planar interface boundaries' Acta Materialia, 52, 795-807 (2004) by J. F. Nie
چکیده انگلیسی
In a recent paper by Nie, it was claimed that there is no two-dimensional continuity of lattice planes across the invariant line. However, it is a property of an invariant line strain that any planes related by the transformation strain must exhibit continuity across the invariant line. This note indicates that the Nie's incorrect conclusion is due to his definition of the shear strain that is different from the standard matrix method.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 52, Issue 7, April 2005, Pages 683-686
نویسندگان
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