Recrystallization textures in fcc materials: A simulation based on micromechanical modeling data

The current paper approaches the problem of recrystallization (RX) textures by using self-consistent simulation techniques, for both low and high stacking fault energy face-centered cubic materials. Stored energies and grain misorientations are outputs of the model allowing grain growth and grain boundary mobility to be dealt with and the further simulation of RX textures.