کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10639946 | 995861 | 2005 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Characteristics of nano-thickness lead zirconate titanate thin film for high-density storage applications
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
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چکیده انگلیسی
We successfully fabricated lead zirconate titanate (PZT) films with film thickness of 70Â nm using a modified solution combined with lead titanate (PTO) seed layer. Throughout various approaches, we have found that the microstructure of PZT film plays an important role in determining the hysteretic properties particularly below the thickness of 100Â nm. We modified the ligands of precursors to improve the microstructure of thin PZT film. In addition, we also adopted a thin PTO seed layer to enhance the initial nucleation density. Finally, we could obtain good electric properties similar to those of 250Â nm PZT. The hysteretic properties such as Q-V, and hysteresis loop seem to be excellent enough to operate at as low as 2Â V, which is a prerequisite property for high-density storage applications.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: B - Volume 122, Issue 1, 25 August 2005, Pages 12-19
Journal: Materials Science and Engineering: B - Volume 122, Issue 1, 25 August 2005, Pages 12-19
نویسندگان
Chang Jung Kim, Yong Kyun Lee,