کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10652423 | 1002048 | 2005 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Electron channeling X-ray microanalysis for partially filled skutterudite structure
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Occupancy of Ce atoms on voids and coordinates of Sb atoms in a partially filled skutterudite CeFe6Ni2Sb24 were determined by the method for atomic location by channeling enhanced microanalysis (ALCHEMI), where characteristic X-ray intensities were measured and calculated at various electron incidence directions in a transmission electron microscope. The calculation was based on dynamical electron diffraction and inelastic scattering theories. The calculated intensities were significantly dependent on the occupation probability of Ce atoms on voids, the coordinates of Sb atoms and the sample thickness. Using the Levenberg-Marquardt least squares method, the occupation probability of Ce atoms and the coordinates of Sb atoms were 0.33 and 0 0.336 0.147, respectively.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Micron - Volume 36, Issue 5, July 2005, Pages 429-435
Journal: Micron - Volume 36, Issue 5, July 2005, Pages 429-435
نویسندگان
Takao Morimura, Masayuki Hasaka,