Preparation and microstructure characterization of novel La2 − xSr2 − xNb2O10 − x oxides

The aim of the present work is to report the study of samples with the La2 − xSr2 − xNb2O10 − x stoichiometry obtained under different synthesis conditions. The materials were characterized and studied by means of Scanning Electron Microscopy (SEM), High Resolution Transmission Electron Microscopy (HRTEM), X-ray diffraction analysis (XRD), and AC Susceptibility. A preliminary identification of the main peaks appearing in the diffraction patterns is shown for the synthesized phases. The La2 − xSr2 − xNb2O10 − x compound undergoes a structural change as a function sintering temperature, with three kinds of the stabilized structure, one is from 1173 < T ≤ 1373 K, another from 1423 < T ≤ 1573 K and the last one from 1623 < T ≤ 1723 K.