کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10668921 | 1008487 | 2005 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Transmission electron microscopy characterization of a Yttria-stabilized zirconia coating fabricated by electron beam-physical vapor deposition
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Yttria-stabilized zirconia (YSZ) film was deposited on to a metal substrate by electron beam-physical vapor deposition (EB-PVD) at 850 °C. The film was characterized by X-ray diffraction, scanning electron microscopy and transmission electron microscopy. The YSZ film predominantly consisted of the tetragonal phase with a small amount of monoclinic phase. In addition, the film was composed of inverted triangular-based pyramidal grains (T-grains) and inverted diamond-based pyramidal grains (D-grains). The T-grains were aligned in the <111> direction and D-grains in <110>. Furthermore, striated lines of nanopores, which were strongly related to the thermal conductivity of the film, were observed in each YSZ grain. The pores are aligned in the <110> direction in the (111) plane and distributed across {114Ì} planes in T-grains, and aligned in the [1Ì10] and the [001] directions in the (110) plane, and distributed across the (001) and (1Ì10) planes in D-grains.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface and Coatings Technology - Volume 194, Issue 1, 20 April 2005, Pages 16-23
Journal: Surface and Coatings Technology - Volume 194, Issue 1, 20 April 2005, Pages 16-23
نویسندگان
T. Kato, K. Matsumoto, H. Matsubara, Y. Ishiwata, H. Saka, T. Hirayama, Y. Ikuhara,