کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10672487 | 1009863 | 2015 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument](/preview/png/10672487.png)
چکیده انگلیسی
We are developing a transmission electron microscope that operates at extremely low electron energies, 0-40Â eV. We call this technique eV-TEM. Its feasibility is based on the fact that at very low electron energies the number of energy loss pathways decreases. Hence, the electron inelastic mean free path increases dramatically. eV-TEM will enable us to study elastic and inelastic interactions of electrons with thin samples. With the recent development of aberration correction in cathode lens instruments, a spatial resolution of a few nm appears within range, even for these very low electron energies. Such resolution will be highly relevant to study biological samples such as proteins and cell membranes. The low electron energies minimize adverse effects due to radiation damage.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 159, Part 3, December 2015, Pages 482-487
Journal: Ultramicroscopy - Volume 159, Part 3, December 2015, Pages 482-487
نویسندگان
Daniël Geelen, Aniket Thete, Oliver Schaff, Alexander Kaiser, Sense Jan van der Molen, Rudolf Tromp,