Gallium-enhanced phase contrast in atom probe tomography of nanocrystalline and amorphous Al-Mn alloys

► Atom probe tomography was used to examine solute distribution in Al-Mn alloys. ► These alloys comprise different amounts of nanocrystalline and amorphous phases. ► Standard analysis methods show uniform Mn distribution, even in the two-phase alloys. ► However, implanted Ga ions were found to segregate to the amorphous phase. ► Using Ga as phase identifiers, the subtle partition tendency of Mn was discerned.