Extended ptychography in the transmission electron microscope: Possibilities and limitations

► Ptychography is an alternative technique for solving phase problem in TEM. ► The extended-Ptychographical Iterative Engine (e-PIE) is an algorithm which allows solving both the probe and the illuminated object phase. ► A topological study demonstrates its capability in TEM. ► Simulations show the robustness to noise and capability to retrieve strong phase object but reveal also a high sensitivity to the probe position uncertainty.