کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10672657 | 1009966 | 2005 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Shear force microscopy with a nanoscale resolution
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
This paper presents a shear force microscope having a nanometric resolution at high scan rates. Current techniques were reviewed and tested, and a design based on the use of a tuning fork is described. The use of a low quality factor enabled us to decrease the response time and increase the stability of the tracking. The microscope was coupled with a tunneling current detection, in order to study the interactions between the sample and the probe during scanning. As an example, a sharp nickel nanotip was used to image a gold surface, showing details down to a few nanometers, even at scanning rates of 4Â Hz.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 103, Issue 3, June 2005, Pages 229-236
Journal: Ultramicroscopy - Volume 103, Issue 3, June 2005, Pages 229-236
نویسندگان
J.-P. Ndobo-Epoy, E. Lesniewska, J.-P. Guicquero,