کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
10672753 1010001 2005 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Prospects for aberration-free electron microscopy
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Prospects for aberration-free electron microscopy
چکیده انگلیسی
Future aberration-corrected electron microscopes that will enable sub-Ångstroem spatial and sub-eV energy resolution are outlined . The sub-Ångstroem transmission electron microscope (SATEM) only compensates for the spherical aberration and reduces the chromatic aberration disc by means of a monochromator. In order to correct for both aberrations, two novel correctors, the ultracorrector and the superaplanator are proposed which will yield a resolution limit of about 0.5 Å and a large field of view of more than 4×106 image points. The superaplanator is best suited for obtaining an achromatic aplanat required for the realization of the high-performance in situ electron microscope of the TEAM project.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 103, Issue 1, April 2005, Pages 1-6
نویسندگان
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