کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10672785 | 1010021 | 2005 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
A separation of the refractive index and topography in photon-scanning tunneling microscopy: Simulations and experiments
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
In order to separate the purely optical and topographic information from images in constant-gap mode simultaneously, we proposed the atomic force/photon-scanning tunneling microscopy (AF/PSTM). In this paper, we focus on the principle of separation of the refractive index image from the images of photon-scanning tunneling microscopy. We prove the formula of refractive index imaging by using a three-dimensional finite-difference time-domain method. The formula indicates that the refractive index of a sample is approximately proportional to photon tunneling information (ÎI/I¯)2. From the viewpoint of practical use, we simulated the refractive index images for the realistic experiments. We present line scans along two orthogonal directions and the transmitted intensity as a function of the tip position under the constant-gap mode. The experimental results are presented and are in good agreement with the numerical results.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 104, Issue 1, August 2005, Pages 1-7
Journal: Ultramicroscopy - Volume 104, Issue 1, August 2005, Pages 1-7
نویسندگان
Xiaoqiu Wang, Jian zhang, Yinli Li, Guoshu Jian, Wei Suen, Shi Pan, Shifs Wu,