Analysis of radiation induced effects in high-density commercial memories on-board Alsat-1: The impact of extreme solar particle events

This paper presents a long-term study on radiation effects in non-hardened high density memory devices operating within the main on-board computer system of the Algerian microsatellite Alsat-1 in Low Earth Orbit (LEO). A statistical analysis of single-event upset (SEU) activity is presented for commercial SRAM devices, and their response to extreme solar events shows SEU rate significant increases correlated with high-energy protons (E > 100 MeV). Ground based neutron monitor data are used to illustrate the long-term correlation between galactic cosmic rays and Alsat-1 upsets. The short-term effects of energetic solar particles are illustrated with space environment data from GOES-11. The Alsat-1 observed SEU rates are compared to the predicted rates based on ground test data and environment models. The prediction results are in good agreement with in-flight data.