کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10716199 | 1027545 | 2005 | 11 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Hard X-ray photoelectron spectroscopy: sensitivity to depth, chemistry and orbital character
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
Photoelectron spectroscopy is growing in importance as a tool for characterizing not only the surface but also the bulk of solids. Photon fluxes of modern synchrotron radiation sources compensate the cross-section lowering of photoelectrons with kinetic energy in the hard X-ray range, the only electrons able to escape from bulk regions. We present examples of photoelectron emission experiments where we measured core and valence photoelectrons up to â¼5Â keV kinetic energy. We studied the evolution of photoelectron emission spectra collected at increasing incident photon energy: core-level spectra of Samarium and its compounds indicate increased bulk-sensitivity, valence band spectra reveal significant cross-section changes of electrons with different orbital character. The chemical and depth sensitivity given by the energy dependence of the attenuation length has been quantitatively assessed in the case of layered GaAs/AlAs/GaAs. These are examples of the wide scientific importance that hard X-ray photoelectron spectroscopy is acquiring in many aspects of the study of solids.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 547, Issue 1, 21 July 2005, Pages 113-123
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 547, Issue 1, 21 July 2005, Pages 113-123
نویسندگان
C. Dallera, L. Braicovich, L. Duò, A. Palenzona, G. Panaccione, G. Paolicelli, B.C.C. Cowie, J. Zegenhagen,